TESCAN, in partnership with Orsay Physics, has launched the AMBER X 2, an advanced plasma FIB-SEM system aimed at revolutionizing materials science research. The AMBER X 2 delivers superior resolution, throughput, and versatility, making it a powerful tool for sample preparation and characterization.
Key features include the MISTRAL Plasma FIB Column™, enhancing beam profiles for better precision and milling performance, and the TEM AutoPrep Pro™, offering fully automated TEM sample preparation. The system’s field-free UHR-SEM Column enables high-resolution imaging without the drawbacks of traditional immersion optics. Additionally, its multimodal and multiscale analysis capabilities, such as 3D ToF-SIMS for detailed elemental analysis, are essential for cutting-edge research, including next-gen battery development.
This breakthrough plasma FIB-SEM technology sets new standards for efficiency and precision in materials science, offering a game-changing alternative to traditional Gallium FIB-SEMs.
This article is a summary of a published press release provided by TESCAN
